QUALITY PLANE · LOT INTELLIGENCE
A release verdict on a lot, from four independent signals
Submit a lot identifier and the defects you observed; get back a release verdict built from the defect profile, the yield pattern, the corrective-action history and the provenance chain.
Defect-pattern lookup runs against a published wafer-map dataset, not against a private table.
The four signals are reported separately, so a verdict can be argued with rather than only accepted.
EVIDENCE
Check it before you trust it
Every result this platform claims is quoted from its receipt in one place, with the command that reproduces it. Nothing on this page needs an account to read.